Tunable Light Source Tunable Light Source

E+S band tunable light source

Ultra-high wavelength accuracy, repeatability and stability, stable output power

Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option

Product Details
Specification Parameters
Document Download
Service Support
Related Products
Product Details


Product Overview

Tunable light source is a necessary instrument for wavelength related testing of passive and active devices in the field of optical communication It can accurately and quickly adjust the appropriate wavelength to meet testing requirements, and can be paid with a high sampling rate power meter

Efficiently collect the power wavelength curve of the device and test its performance parameters at different wavelengths

TopLight Tunable Light Source is the first tunable light source developed by Dimension Technology, which integrates 16 years of professional experience in the field of optical testing It has high wavelength accuracy, fast scanning speed, high output power stability, and full

The characteristic of no mode hopping in the frequency band The product has high integration, compact size, flexible operation, and can be matched with the high speed power meter and polarization controller of Dimension Technology to meet all testing requirements of wavelength division multiplexing devices

Main advantages

Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option

Main applications

WDM scanning test
Optical passive system testing
Wavelength correlation test
Specific wavelength output

Ultra high wavelength accuracy, repeatability, and stability, with stable output power

The TopLight tunable light source guarantees a wavelength accuracy of ± 20pm through precision electrical control, ensuring reliable wavelength repeatability and stability even during high speed scanning In different

In the testing environment, TopLight can also compensate for environmental changes, ensuring stable and correlated wavelength accuracy


The output power of the light source is strictly fitted for wavelength correlation, ensuring that the flatness of the power curve is higher than 0.2dB/nm, reducing the error caused by power on the testing system

High output spectral signal to noise ratio and edge mode compression ratio

TopLight uses the principle of external activity response to tune the wavelength, and through precision optical and electrical control systems, guarantees that the narrow linewidth laser output from the resonant activity always has good signal to noise ratio and edge mode compression ratio, in order to achieve rigorous control

The wavelength scanning system provides Excel testing environment and conditions


Realize uniform and no mode hopping across the entire wavelength range, ensuring continuous wavelength curves

The integration capability of opto electromechanical computing in Dimension Technology provides reliable assurance for the mode control of tunable light sources Through precision control and algorithms, TopLight can ensure ultra high scanning speed and wavelength accuracy before

Please confirm that the last always outputs the dominant wavelength of the main mode, and the test can be completed without the need for wavelength calibration components during scanning&Nbsp;


Implementing Optical Device Scanning Testing with a Wavelength Scanning System


The wavelength scanning system independently developed by Dimension Technology is equipped with TopLight tunable light source and high speed power meter, with a wavelength accuracy of ± 5pm and a fast scanning speed of 100nm/s, providing a solution for wavelength related devices

Efficient and accurate testing solutions Based on years of design experience, Dimension Technology provides system software with good human machine interaction, allowing users to easily and clearly complete wavelet scanning tests with just a few steps

Click the button to obtain a detailed test report Furthermore, due to the platform+modular design architecture, the equipment of Dimension Technology has extremely high flexibility when demand changes occur, and can be upgraded by simply adding, reducing, or replacing modules

The new testing environment has saved users a lot of time and economic costs


Multiple selectable wavelength ranges, covering various device application scenarios


Performance Parameter

CategoryParameterTLS Tunable Light Source
Wavelength characteristicsWavelength tunable range1355-1505nm
Wavelength resolution0.1pm
Wavelength Stability± 5pm
Wavelength accuracyAbsolute accuracy± 20pm
Absolute accuracyStepwise scanningSoil 10pm
Repeatability± 5pm
Absolute accuracyContinuous scanning @ 100nm/s± 20pm
Repeatability± 10pm
Maximum scanning speed200nm/s
Output power characteristicsOutput powerPeak value+13dBm
≫ 10dBm range1260nm-1360nm/1525nm-1630nm
Full wavelength tuning range+13-15dBm
StabilitySoil 0.01dB
RepeatabilityStepwise scanning± 0.01dB
FlatnessSoil 0.2dB
RepeatabilityContinuous scanning @ 100nm/s± 0.01dB
FlatnessSoil 0.2dB
Relative intensity noise (RIN) (typical value)145dB/Hz (1MHz to 3 GHz)
Spectral characteristicsLine width200KHz

Ordering information


Easily access services and support from Dimension

Want help or have questions?