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Tunable Light Source
TopLight Tunable Light Source is the first tunable light source developed by Dimension Technology, which integrates 16 years of professional experience in the field of optical testing. It has the characteristics of high wavelength accuracy, fast scanning speed, high output power stability, and no mode hopping in all bands. The product has high integration, compact size, flexible operation, and can be matched with the high-speed power meter and polarization controller of Dimension Technology to meet all testing requirements of wavelength division multiplexing devices.
Product Overview
Tunable light source is a necessary instrument for wavelength related testing of passive and active devices in the field of optical communication. It can accurately and quickly adjust the appropriate wavelength to meet testing requirements. Coupled with a high sampling rate power meter, it can efficiently collect the power wavelength curve of the device and measure its performance parameters at different wavelengths.
TopLight Tunable Light Source is the first tunable light source developed by Dimension Technology, which integrates 16 years of professional experience in the field of optical testing. It has the characteristics of high wavelength accuracy, fast scanning speed, high output power stability, and no mode hopping in all bands. The product has high integration, compact size, flexible operation, and can be matched with the high-speed power meter and polarization controller of Dimension Technology to meet all testing requirements of wavelength division multiplexing devices.
Main advantages
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal-to-noise ratio and edge mode suppression ratio
Full band without mode hopping
C+L band or O band optional
Main applications
WDM scanning test
Optical passive system testing
Wavelength correlation test
Specific wavelength output
spectroscopy
Ultra high wavelength accuracy, repeatability, and stability, with stable output power
The TopLight tunable light source ensures a wavelength accuracy of ± 20pm through precise electromechanical control, ensuring reliable wavelength repeatability and stability even during high-speed scanning. TopLight can also compensate for environmental changes in different testing environments, ensuring stable and reliable wavelength accuracy.
The output power of the light source is strictly fitted for wavelength correlation, ensuring that the flatness of the power curve is higher than 0.2dB/nm, reducing the error caused by power on the testing system.
High output spectral signal-to-noise ratio and edge mode suppression ratio
TopLight uses the principle of external cavity resonance to tune the wavelength, and through precise optical and electromechanical control systems, ensures that the narrow linewidth laser output from the resonant cavity always has good signal-to-noise ratio and edge mode suppression ratio, providing an excellent testing environment and conditions for rigorous wavelength scanning systems.
Realize uniform and no mode hopping across the entire wavelength range, ensuring continuous wavelength curves
The integration ability of opto electromechanical computing in Dimension Technology provides a reliable guarantee for the mode control of tunable light sources. Through precise control and algorithms, TopLight can confirm that the laser always outputs the dominant mode wavelength while ensuring ultra-high scanning speed and wavelength accuracy. Testing can be completed without the need for wavelength calibration components during scanning.
Implementing Optical Device Scanning Testing with a Wavelength Scanning System
The wavelength scanning system independently developed by Dimension Technology is equipped with TopLight tunable light source and high-speed power meter, with a wavelength accuracy of ± 5pm and fast scanning of 100nm/s, providing an efficient and accurate testing solution for wavelength related devices. Based on years of design experience, Dimension Technology provides system software with good human-machine interaction, allowing users to easily and clearly complete wavelength scanning tests. Users only need to click the test button to obtain detailed test reports. Moreover, due to the platform+modular design architecture, the equipment of Dimension Technology has extremely high flexibility when demand changes. It can be upgraded to a new testing environment by simply adding, deleting, or replacing modules, saving users a lot of time and economic costs.
Multiple selectable wavelength ranges, covering various device application scenarios
performance parameter
ordering information
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