Bert & CDR Bert & CDR
Bert & CDR

Optical Signal Testing
High-speed, flexible configuration, stable and reliable, cost-effective and practical.


To meet the growing testing needs for 800G/1.6T high-speed optical transceiver modules, Dimension Technology has launched the BERT800 series high-speed bit error rate tester and the CR600 series optoelectronic clock recovery units, providing a stable, accurate, and cost-effective testing solution for the integrity of high-speed signals. In conjunction with Dimension Technology's optical performance testing product series and automated production and manufacturing services, it is convenient to build customized testing systems according to the specific process requirements of customers.

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High-speed Signal Testing Configuration

High-speed signal testing systems typically consist of two parts: hardware and software. The hardware part mainly includes high-precision test equipment and high-bandwidth oscilloscopes, signal generators, etc.; the software part mainly includes data processing and analysis software, which can perform real-time processing and analysis of the collected data. Additionally, to improve testing efficiency and accuracy, automated testing techniques can be employed, such as automated testing algorithms based on machine learning.


Common Techniques for High-Speed Signal Testing

During high-speed signal testing, common testing methods include waveform testing, signal integrity testing, jitter analysis, and eye diagram testing. Waveform testing is typically conducted using oscilloscopes, focusing on parameters such as amplitude, edge, and glitches of the waveform. Signal integrity testing pays attention to the quality of the signal during transmission, including factors like impedance matching and crosstalk. Jitter analysis and eye diagram testing are used to assess the timing stability and data transmission quality of the signal.


Development Trends in High-Speed Signal Testing

The development trends in high-speed signal testing may include higher sampling rates and data processing speeds, more accurate testing equipment and algorithms, and more efficient automated testing technologies. These advancements will help meet the testing demands for high-speed signals with higher frequencies and shorter pulse widths, driving the development of related technical fields.




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