Testing Testing

Camera type spot analyzer

Real-time display and analysis of optical spots from 400 to 1700nm!

A single model can meet the measurement of light spots in the range of 400-1700nm
2D spot real-time display
Real time analysis of 3D power distribution
Very suitable for complex spot testing with high order transient modes
Standard configuration of 6 attention pads to meet a wide range of power testing requirements
Combining spot analysis function with scientific camera imaging

Product Details
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Product Details


Full range | Scanning slide style | Camera style | M2 factor | Simple and user friendly software

Dimension Labs has launched a series of Beamhere spot analysts, which, together with general software, achieve complete beam quality analysis functions

Spot energy distribution and beam divergence angle, M ² Factor is an important component of last beam quality detection, and effective and accurate measurement and analysis are prerequisites for fully utilizing last The Beamhere series products have complete functions and can be used to inspect and evaluate scenarios such as beam shaping, focusing spot, and beam consolidation They also provide spot parameters that comply with the ISO11146 standard, such as beam width, peak center, and ellipticity All series products can be optionally acquired with M ² Factor testing module to achieve beam wait position, beam divergence angle, and M in the direction of beam propagation ² Measurement of factors BeamHere qualifications the evaluation of last beams and outputs test reports with just one click from the software, accurately and effectively completing beam analysis

A full range of products that meet a wide range of testing needs | M2 factor testing modules that are compatible with all Beamhere spot analysts | Independently developed and carefully designed analysis software | The software truly achieves interactive friendship, simplicity, and ease of use, with one click output of test reports

A full range of products that meet a wide range of testing needs

The scanning slide type spot analyzer series and camera type spot analyzer series launched by Dimension Labs are divided into different applicable bands to form a complete product series, covering a wide range of spot testing needs in various bands

Adapt to all Beamhere spot analysts with M ² Factor testing module

The M2 factor testing module launched by Dimension Labs measures quality evaluation parameters such as M2 factor and beam divergence angle in the direction of beam propagation, and is compatible with scanning slit type spot analysts and camera type analysts

Independently developed and carefully designed analysis software

The Beamhere Laser Beam Analyzer beam analysis software developed by Dimension Labs is compatible with all hardware modules in the Beamhere series of beam measurement products Dimension Labs strictly controls customer experience, with a clear and decision interface, and consensus and effective operation



Camera type spot analyzer

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Main advantages

A single model can meet the measurement of light spots in the range of 400-1700nm

2D spot real-time display

Real time analysis of 3D power distribution

Very suitable for complex spot testing with high order transient modes

Standard configuration of 6 attention pads to meet a wide range of power testing requirements

Combining spot analysis function with scientific camera imaging


A single model can meet the measurement of light spots in the range of 400-1700nm

DimeThe short wave infrared wavelength spot analyzer launched by NSON Labs has a spectral response range of 400-1700nm, covering the measurement needs of conventional visible and near infrared wavelengths


1、400~1700nm的光谱响应范围.jpg


2D spot real-time display and Real time analysis of 3D power distribution

The BeamHere camera based spot analyzer can refresh the image at a high frame rate in continuous measurement mode, reflecting real-time changes in the spot At the same time, the 3D view can also be analyzed in real time and viewed from any angle Real time is a Huge advantage in dynamic testing, optical system adjustment, or time monitoring

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Suitable for complex spot testing with high order transient modes

Camera based imaging is a process where multiple pixels provide feedback on the shape of the same spot at different positions on the cross section Therefore, even if the energy distribution of the spot is irregular or non Gaussian and contains higher order transformer modes, it can be accurately measured by the camera based spot analyzer

3、常见光速.jpg

Standard configuration of 6 attention pads to meet a wide range of power testing requirements

Dimension Labs; The camera type spot analyzer launched ads a unique filter wheel structure, which can install up to 6 filters with different wavelengths and attention inside the wheel, achieving the maximum power measurement range in the most compact way The filter can be easily replaced by gene rotation, achieving simple operation and effective measurement

4、滤光片转轮结构.jpg


Combining spot analysis function with scientific camera imaging

The detachable design of the spot analysis camera and filter wheel greatly expands its functional applications The disassembled camera, combined with additional camera driver software, can meet the application requirements of CMOS cameras or shortwave red cameras for scientific imaging

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M ² Factor testing module

Module Description

Dimension Labs has launched the M2 testing module for the camera based spot analyzer and scanning slide spot analyzer series products, which can measure beam quality characteristic parameters such as M2, divergence angle, wait position, wait diameter, etc. for laser propagation quality detection

Main advantages

Automatic measurement of slide rails
Software automatic analysis
Compact in size
Universal mounting hole, easy to disassemble and assemble

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Technical Introduction

The scheme of using a fixed lens and a moving probe, while ensuring lens aberration, commonly collects multiple images during measurement; Z  Calculate the beam width at the axis position; M2; Factor and other beam parameters In order to comply with the ISO11146 standard and improve measurement accuracy, data collected in the direction of light propagation is greater than; 10  The bundle width at positions must have at least  5  The length of the wait is located at a point within one Rayleigh distance range



Analysis software

The BeamHere spot analyzer software developed by Dimension Optoelectronics is guided by clear and consistent logic design, easy operation, and user friendly visual presentation It considers different usage scenarios and creates practical and effective operation software for users




Performance parameter


Product model DL-BH-CMOS-400-1100  DL-BH-CMOS-400-1700

Sensor typeCMOSInGaAs
Applicable wavelength400-1100nm400-1700nm
Measuring beam diameterFifth five μ M~11mmFifth μ M~6mm
Measuring optical powerμ W~1Wμ W~1W
Pixel sizeFive points Five μ MFive μ M
Pixel format8bit, 12bit8bit, 12bit
Resolving powerTwo thoughts and force eye × Two thoughts and force eyeSix hunted and five six × Five hunted and two
Chip typeSiInGaAs
Dynamic range60dB56dB
ShutterShutter
Shutter typeAuto Exposure/Manual Exposure
DisplayBlack and white/false color
Exposure timeThird μ S~10sTen μ S~100ms
Data interfaceUSB 3.0
External dimensionsTwenty nine × Twenty nine × 30mmTwenty nine × Twenty nine × 40mm
Working temperature-10 ° C to 50 ° C
Storage temperature-30 ° C to 70 ° C
AttentionExternal attention pads (OD4, OD6)
AuthenticationCE, RoHS, KC


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