Technical background

With the rapid development of fiber optic communication technology, the demand for high-speed and high-performance optoelectronic transceiver components is increasing day by day. The expansion of data centers, the construction of 5G networks, and the popularization of cloud computing are all driving the industry's demand for high-speed optical modules of 800G and above. In order to meet these high-performance indicators, testing solutions for optoelectronic transceiver components such as semiconductor laser chips, TOSA, and ROSA must keep up with technological progress to ensure the reliability and efficiency of the components.

Solution

Introduction to Optoelectronic Transceiver Components

Optoelectronic transceiver components are the core of optical communication systems, responsible for converting electrical signals into optical signals (TOSA) and restoring optical signals to electrical signals (ROSA). These components must have high-speed transmission capability and extremely high signal integrity.

Key performance parameters

Optical power output: The optical power output of semiconductor laser chips and TOSA is a key factor affecting the quality of optical links.

Sensitivity and wavelength range: The sensitivity and wavelength range of ROSA directly affect the quality of the received signal.

Bandwidth and signal integrity: The maximum data rate and signal integrity supported by the component must be tested.

Test environment settings

In a specific cleanroom environment, use advanced spectral analyzers, power meters, oscilloscopes, and source meters to build the testing environment. All equipment must be calibrated to ensure the accuracy of test results.

Static and dynamic testing programs

Static testing: including testing the threshold current and voltage characteristics of the laser chip.

Dynamic testing: Conduct eye diagram analysis of TOSA and signal-to-noise ratio testing of ROSA. At the same time, perform temperature and aging tests to simulate actual operating conditions.

Output power testing: One of the most important parameters of a laser is the output power of the light source, and a high-precision optical power meter is the best assistant for testing.

LIV testing: Our solution includes conducting LIV testing on semiconductor laser chips, which is a key step in measuring laser performance. Through this test, we

Being able to plot the relationship between optical power, current, and voltage, i.e. LIV curve, to ensure that each laser can operate at its optimal operating point.

Spectral testing: Test the spectral curve of the light-emitting device to ensure normal resonance of the laser within the working band.

Data analysis and troubleshooting

Identify component performance deviations by conducting in-depth analysis of test data and comparing it with industry benchmarks. Develop a detailed troubleshooting process to quickly resolve issues discovered during testing.

Quality assurance and compliance

Ensure that all testing procedures comply with international standards such as IEEE, ITU, and IEC. Perform reliability testing and lifespan estimation, and record the testing process in detail to meet the requirements of quality audits.

Future Trends and Technologies

Analyze how new materials and designs affect testing solutions, explore trends in testing automation in high-yield production, and examine the impact of advanced modulation technologies on testing methods.