The Prospects of MPO

MPO jumper is an important passive product for constructing optical networks, which enables active connections between optical network devices and between devices and jumpers, achieving precise docking. It requires stable transmission, high reliability, and customization, and is widely used in optical network scenarios such as backbone networks, fiber optic distribution, and data centers.

With the boom of artificial intelligence, digital reality, AI, and other technologies, network traffic is reaching unprecedented levels. Cloud operators are expanding their data centers, increasing data throughput and connector demand. MPO connectors can efficiently utilize space, thereby increasing data capacity. However, facing many challenges, it requires a significant investment of time to conduct testing and troubleshooting.

Plan Introduction

With the widespread application of MPO (including MTP) connectors worldwide, MPO end face detection and performance testing face many challenges, including high demand, high-speed transmission, data stability, low bit error rate, and high yield requirements, making MPO end face detection and performance testing increasingly important. After years of independent research and development, Dimension Technology has carefully crafted a complete set of intelligent, fast, efficient, and reliable MPO detection and cleaning solutions for the detection and cleaning needs of MPO production, manufacturing, and application processes. These solutions mainly include: 3D morphology detection of MPO end faces, MPO end face quality detection, MPO polarity insertion loss performance testing, MPO end face cleaning, etc.

Challenges Faced

In the MPO production process, users face the following pain points:

The demand is large and the structure is complex, requiring efficient cleaning and testing to control the quality of connectors.

The production cost is high, requiring a large amount of manpower and low efficiency.

Higher requirements for quality and craftsmanship, comprehensive improvement in quality requirements, stable data, low bit error rate, low insertion loss, and high return loss are required.